This slide shows data that is provided from tests conducted in 3M’s lab for crosstalk between two latch eject headers using two test boards. These results show modest increases in NEXT (Near End Crosstalk) and FEXT (Far End Crosstalk) as rise time goes from 250, to 100, and finally to 50 picoseconds for both differential and single-ended tests. More test details can be found in the white paper included on the CD ROM with each development kit.